Electron Probe Micro Analyzer :
EPMA applications have special advantage, as they involve non-destructive in-situ analysis of minerals in polished thin sections, retaining textural relationships among coexisting minerals. It allows qualitative and quantitative analysis of individual mineral grains a few micrometers in diameter.
Electron Backscatter Diffraction :
Electron Backscatter Diffraction (EBSD) is a scanning electron microscope (SEM) based technique that gives crystallographic information about the microstructure of a sample. EBSD has become a well-established accessory for the SEM, which is used to provide crystallographic information routinely.
Doubly Polished Thin Sections
:
High-quality, polished thin samples of rocks and minerals are an important tool for petrographic studies. Polished thin sections are ideal for a number of petrographic applications, including reflected-light petrography and electron microprobe analysis.
